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Datenblatt Literaturnummer Veröffentlichungsdatum BERTScope Clock Recovery Datasheet
65W-25479-9
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Handbücher Handbuchtyp Teilenummer Veröffentlichungsdatum Tektronix BERTScope
Clock Recovery Declassification & Securities InstructionsGeheimhaltungsaufhebung 077110200 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualProgrammierer 077069605 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualProgrammierer 077069604 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualProgrammierer 077069603 Tektronix BERTScope
Clock Recovery Instruments Quick Start User ManualHauptbenutzer 071285202 Tektronix BERTScope
BSAPCI3 InstructionsBenutzer 071304600 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualProgrammierer 077069602 Tektronix BERTScope
Clock Recovery Instruments Quick Start User Manual.Hauptbenutzer 071285201 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualProgrammierer 077069601 BERTScope Clock Recovery Quick Start Guide
This Quick Start User Manual supports the Tektronix BERTScope CR125A, CR175A, and CR286A Clock Recovery instruments. Quick Start User ManualBenutzer 077055700 BERTScope
Clock Recovery Instruments Quick Start User ManualBenutzer 071285200
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Technische Dokumente Dokumenttyp Veröffentlichungsdatum Stress Calibration for Jitter >1UI
While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for …Anwendungshinweis Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and characterization example using a Single Mode 1310 nm laser SFP+ …Einführungshandbuch Stressed Eye Primer
In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.Einführungshandbuch PCI Express® Transmitter PLL Testing — A Comparison of Methods
There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of use, ease of setup, and initial cost. In addition …Einführungshandbuch Stressed Eye: “Know What You’re Really Testing With”
BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.Einführungshandbuch Clock Recovery Primer, Part 2
Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.Einführungshandbuch Clock Recovery Primer, Part 1
Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.Einführungshandbuch Dual-Dirac+ Scope Histograms and BERTScan Measurements
This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.Einführungshandbuch Evaluating Stress Components using BER-Based Jitter Measurements
This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not contribute pattern-dependent effects, and finally …Einführungshandbuch BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
Delve into jitter problems in new ways, such as examining Random Jitter on each edge of the data pattern, separating out the jitter caused by transmitter pre-emphasis, and performing jitter decomposition on long patterns such as PRBS-31.Anwendungshinweis Comparing Jitter Using a BERTScope® Bit Error Rate Testing
Comparison of DCD and F/2 Jitter.Anwendungshinweis Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
Six sigma is a form of mask testing that provides for critical insight when mask testing depth specification are important for pass/fail testing or deeper evaluation on high-speed signaling standards to provide a significantly more complete picture …Anwendungshinweis Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial
BER Contour Measurement - What it is, how it is constructed, and why it is a valuable way of viewing parametric performance at gigabit speeds.Anwendungshinweis Clock Recovery’s Impact on Test and Measurement
As clock recovery becomes increasingly common in more systems and test setups, its effects on measurements must be considered. Many outside influences can disturb the relationship between data and how it is clocked. By understanding the relationship …Anwendungshinweis Anatomie eines Augendiagramms: Wie es konstruiert und ausgelöst wird
Abstract In diesem Artikel wird beschrieben, was ein Augendiagramm ist, wie es aufgebaut ist und welche Trigger-Methoden zur Erstellung eines Augendiagramms verwendet werden. Außerdem werden verschiedene Möglichkeiten beschrieben, wie …Anwendungshinweis BERTScope™ CR125A+ 175A+ & 286A Clock Recovery Fact Sheet
Key Specs and Ordering Information for BERTScope CR125A, 175A, & 286A Clock Recovery.Datenblatt BERTScope Content Archive
To request copies of historical content from SyntheSys Research (now Tektronix Inc.) related to BERTScope and the following applications, please click the link below.Request NowTechnisches Informationsblatt
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Software Dokumenttyp Teilenummer Veröffentlichungsdatum BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5608
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …Anwendungsgebiet 063430807 BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5522
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …Anwendungsgebiet 063430806 BERTScopePC Software, V 10.15.1284
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B, DPP125C)and BSAITS instruments that are being operated as stand-alone instruments, i.e. not …Anwendungsgebiet 063430803 BERTScopeCR Help File V1.0
BERTScope Clock Recovery Instrument Help File for offline use.Anwendungsgebiet 066130900 BERTScopePC Software V 10.9.1024
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to …Anwendungsgebiet 1000000482
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FAQs – Häufig gestellte Fragen FAQ-ID On the PCIe PLL Bandwidth Tester Windows application that's used with the CR286A, there is a drop down under "Options" called "Enhanced Measurement" and has the options of "Standard", "Sensitive", and "Disabled".What does each option do?
In 8G mode only, some DUT’s are sensitive to the initialization routine, which involves forcing a re-lock of the DUT PLL several times to optimize the peaking measurement.The “Standard” selection uses a method that toggles the CR divider reset to …72106 What is the electrical specifications for SMAPOWERDIV used with the Clock Recovery in Tektronix BERT scopes?
NOMINAL IMPEDANCE: 50 ohm FREQUENCY RANGE: dc to 18.0 GHz INSERTION LOSS (between input & either output arm): 6 dB nominal, -0.2 dB, +1.2 to 10 GHz, 1.5 to 18 GHz MAXIMUM INPUT POWER: 1 watt CW, 1 kilowatt peak (5 μsec pulse width, 0.05% duty cycle …64616 How do I use TekExpress to perform a USB 3.0 Device Transmitter Test?
USB 3 Tx Testing ScriptHello and welcome to Tektronix! Today I’m going to walk through a USB 3 Device Transmitter Test using TekExpress.A USB 3 Transmitter test consists of acquiring the signal from a USB 3 Device and running it through various tests …69376
